New Generation of FISCHERSCOPE® X-RAY: XDLM and XDAL Series

The newest generation of the proven FISCHERSCOPEA(R)XDAL and XDLM x-ray spectrometers is now available from Fischer Technology. The development processfocused on the unit's performance, ergonomics and design. Typical applicationsare measurements on pc-boards, plug contacts and electronic components.

XDLM spectrometers are equipped with four exchangeableapertures and a programmable XY(Z) measuring stage. This makes them ideallysuited for testing mass-produced parts.

The XDALspectrometers with silicon PINdetectors provide reliable analysis results and coating thickness readings evenwith a small concentration and very thin coatings. With their fast and highlyprecise XY(Z) measuring stage, they are ideally suited for automated samplemeasurements.

The XDAL andXDLM spectrometers have an excellent long-term stability, which is reflected ina significantly reduced calibration effort, among other things. Using theFISCHER fundamental parameter method, coating systems as well as solid andliquid samples can be analyzed standard-free.

New Generation of FISCHERSCOPE(R) X-RAY: XDLM and XDAL Series_A