Yokogawa's MT6530 Series Wafer Memory Test Systems

The newly developed MT6530 series, which succeeds Yokogawa's MT6121 wafer memory testsystem, features enhanced test frequency and increased parallel testingefficiency. This results in a 75 percent reduction in test time per 300 mmwafer. The MT6530 series is targeted mainly at the mass production of DRAM*1 aswell as NAND, NOR and other types of flash memory *2.

The MT6530 series testers can simultaneously test a maximumof 1,536 DUTs, which is triple the throughput of the MT6121.This has been madenecessary by advances in shrinking technology, which have increased the numberof chips that can be obtained from a single wafer.

The MT6530 series testers have a maximum 444 MHz operatingfrequency and transfer data at 888 Mbps, which is 1.6 times faster than the MT6121.The MT6530 series testers are therefore well suited for high-speed,high-frequency tests of DRAMs for mobile phones, smart phones and tablets.

Applications: Pass/fail tests, redundancy tests, and KGD*3 tests of DRAMs

*1 A type of random access memory that reads and writes datain any order and is volatile (needs to be refreshed periodically). It is mainlyused for personal computers.

*2 NAND: a type of non-volatile flash memory that is alwayswritable and readable. Flash memory cards of this type have greater storagedensities and are used for digital cameras and the like. NOR: a type of non-volatile flash memory that offers superiorrandom access performance and is commonly used in cellular phones

*3 Refers to the practice of guaranteeing quality by testinga wafer before individual chips are packaged and shipped to end users. Alsorefers to chips that have been tested in this manner.

*4 Stands for low power double data rate 2. This is a DRAMstandard established by the JEDEC Solid State Technology Association of the US.This also refers to chips that meet that standard. LPDDR2 is used mainly inportable electronic devices such as cellular phones. KGD tests are essential inthe production of LPDDR2s.

Yokogawa Electric Corp.'s MT6530 series of wafer memory testsystems will be released in January 2011.

Yokogawa’s MT6530 Series Wafer Memory Test Systems