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Tektronix Takes Aim at Testing Wide Bandgap Chips
Testing solution optimizes measurement of wide bandgap devices.
June 5, 2023
3 Min Read
Tektronix’s Wide Bandgap Double Pulse Test software algorithm helps test engineers measure and characterize wide bandgap semiconductors including SiC and GaN. Tektronix
Much of the development in transistor technology in recent years has been in wide bandgap devices such as GaN (Galllium Nitride) and SiC (Silicon Carbide), as these technologies provide the performance characteristics needed for applications such as electric vehicles, industrial controls, and solar energy. One challenge that has arisen from the increase in wide bandgap devices has been the difficulty in measuring and characterizing the performance of these parts, with existing being time consuming and unreliable.
Tektronix has developed a software-based algorithmic solution, called WBG-DPT, that measures the switching parameters and evaluate the dynamic behaviors of power devices, enabling test engineers to optimize their designs confidently and quickly. According to Shubha B, Tektronix Marketing Manager, most wide bandgap device users have had to manually save waveforms and export them to tools such as Excel or LabVIEW. She added that users would often resort to homebrewed solutions and have to iterate these solutions across multiple devices under test, which was time consuming and increase to project delays and longer time-to-market.
The algorithm is optimized to run on Tektronix 4, 5 and 6 Series MSO oscilloscopes. It boasts several industry-first measurement capabilities. These include overlapped reverse recovery plot, ·auto and custom reference levels and integration points, annotation and navigation, and control of single and multiple pulse results and statistics.These capabilities make it easier for engineers to see reverse recovery details for multiple pulses overlaid on a single display.
The WBG-DPT Solution's uses a wide bandgap deskew technique that eliminates the need for rewiring and may even be performed after double pulse measurements have been taken. To simulate the effects of delays in the test setup, the software generates an alignment waveform. The engineer adjusts a few settings to match the alignment waveform with the measured waveform, as the software corrects any differences in delays. This process reduces the deskew time from an hour or more to just 5 to 10 minutes, according to the company,
Since power converters must operate over a wide range of temperature conditions, there is a growing need to measure output charge (QOSS) at different junction temperatures. Tektronix’s WBG-DPT algorithm boasts fast and accurate QOSS measurements, providing insight into the effects of device output capacitance.
With the Tektronix WBG-DPT algorithm, reverse recovery timing plots enable engineers to see reverse recovery details for multiple pulses overlaid on a single display. Measurements are made per JEDEC and IEC standards, and users can configure measurements in WBG solution to query results on every first or second pulse, or all pulses of a double pulse set. This approach to reverse recovery plotting allows for multiple double pulse sets and provides visual and measurement results on each set.
The Tektronix Wide Bandgap Double Pulse Test algorithm is available now for global customers.
Spencer Chin is a Senior Editor for Design News covering the electronics beat. He has many years of experience covering developments in components, semiconductors, subsystems, power, and other facets of electronics from both a business/supply-chain and technology perspective. He can be reached at [email protected].
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