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Part IV: Production Test

This lecture will cover the challenges associated with production testing of wireless hardware. We will discuss strategies for optimizing test speed, maximizing yields, and minimizing false failures. We will also examine test fixturing for over-the-air coupling to a wireless device under test (DUT).

This lecture will cover the challenges associated with production testing of wireless hardware. We will discuss strategies for optimizing test speed, maximizing yields, and minimizing false failures. We will also examine test fixturing for over-the-air coupling to a wireless device under test (DUT).