When Will the Automotive Industry Adopt Multi-Die Designs?When Will the Automotive Industry Adopt Multi-Die Designs?

The growing complexity of automotive safety and infotainment systems is dictating the use of more powerful, flexible semiconductor solutions, which multi-die packages can provide.

Christian Malter, Executive Director - Sales Central Europe

December 13, 2024

8 Min Read
Multi-die packages are expected to more usage in future vehicles.
Multi-die packages have the potential to meet the high-performance computing needs of future vehicle systems.Huseyin Asliyuce/ iStock / Getty Images Plus

The compute requirements of next-generation software-defined vehicles (SDVs) are growing exponentially, with customers demanding smartphone-like entertainment experiences as well as semi-automated driving capabilities. As Moore’s law slows down, the required compute performance pushes the size of commercially available monolithic SoCs to the limit of what is technically and economically viable.

Moreover, with the desired convergence (fusion) of advanced driver assistance systems (ADAS), in-vehicle infotainment (IVI), and other central functions into a single, integrated high-performance compute platform, the dependence on very few semiconductor vendors (vendor lock-in) concerns most OEMs. OEMs seek flexible semiconductor solutions, which they can scale along their vehicle portfolio from entry-level to premium-level cars, ideally keeping the same core compute architecture to avoid software porting while allowing for hardware scalability to the respective software workload.

Multi-die design, which is already state-of-the-art in the high-performance computing, AI, and data center domains, is being discussed in the automotive industry.

Chiplet program

Companies around the globe have come together to work towards a unified, standard process to ease the shift to muti-die designs for the automotive market. One example is the imec Automotive Chiplet Program (ACP). In a recent announcement, imec announced that Synopsys, among others, are the first that have committed to join its Automotive Chiplet Program (ACP), which brings together stakeholders from across the automotive ecosystem to evaluate which chiplet architectures and packaging technologies are best suited to support car manufacturers' specific high-performance computing and strict safety requirements, while striving to extend the benefits of chiplet technology – such as increased flexibility, improved performance and cost savings – to the entire automotive industry.

Related:Chiplets Make Case for More Apps

Automotive OEMs are aware of multi-die architecture and are assessing its advantages for automotive applications. Their vision is to integrate multiple heterogeneous or homogeneous dies in a single package, similar to electronic control units (ECUs) today, which comprise multiple monolithic SoCs on a printed circuit board (PCB) in a much smaller form factor and lower power footprint. Connecting the dies (also called chiplets) with dedicated die-to-die interfaces, such as the Universal Chiplet Interconnect Express (UCIe), consumes less power compared to traditional chip-to-chip connections. OEMs are looking to combine heterogeneous chiplets from different vendors to create optimized, modular, and scalable central compute platforms for their future ADAS and IVI needs.   

Related:Cheeky Chiplets Meet Super NoCs

Cost and standards remain hurdles

But as automotive OEMs and Tier 1s explore the use of multi-die design, they face several challenges. Developing a multi-die design is complex, requiring the right expertise and resources. It is too costly to be carried out by one automotive company alone. In addition, creating an open chiplet ecosystem would require standardizing the overarching architectural structure and the underlying die-to-die connectivity, which is way beyond what available die-to-die-interface standards, such as UCIe, define today. While this dilemma is understood and might be solvable through smart industry consortia and standardization efforts, two challenges remain:

  1. Quality & reliability:  Can multi-die designs, with tens of thousands of bump connections between chiplets, interposers, and package substrate, deliver the required long-term reliability in the harsh automotive operating environment, with mission profiles approaching 135,000 hours of operation (always on) and with all its mechanical and thermal stresses?

  2. Business: Who takes the system integrator role, sources chiplets from different vendors, assembles and tests the resulting multi-die design and takes the responsibility and liability for delivery with quality? Will the margin stacking defeat the commercial benefit of multi-die vs. monolithic SoCs?

 Levels of autonomy

The six levels of autonomous driving have each entailed different types of chips. While the lower levels can be handled with advanced microcontrollers, Level 2+ onwards requires complex SoCs with a mix of high-performance CPUs, AI accelerators, DSPs, and GPUs. Level 3 operates with a much broader and higher resolution sensor set and requires orders of magnitude more compute power than Level 2. Single-chip Level 3 solutions are available in the market, but require highly optimized AI and single instruction, multiple data (SIMD) hardware accelerators, tailored exactly to the software algorithms running on them. Different OEMs have different algorithm strategies and might require more flexibility regarding the hardware acceleration technologies available on such SoCs. Level 4 again requires more compute power than Level 3, clearly challenging what can be done on a monolithic SoC in an economically viable way.

levels-of-driving-automation.jpg

Two different conceptual approaches are being contemplated in the market today:

  • One approach is to split a very large monolithic SoC into smaller function-specific chiplets, e.g. for CPU, GPU, AI, sensor preprocessing, etc. This allows the OEM to mix, match, and scale the optimal chiplet choice.

  • The other approach is to create a base die—for autonomous driving Level 2+ with all the interfaces and functionality needed—as a monolithic SoC. From here, extension dies can be added via die-to-die interfaces to enhance the AI, SIMD, and compute performance for higher levels of autonomy.

Of the two, the latter concept has a lot of merit to satisfy the industry’s ultimate desire for a scalable, combined (fused) ADAS/IVI central compute platform for future SDV generations.

Automotive benefits

For the semiconductor industry, the multi-die design approach is a paradigm shift that can enable a new wave of growth. In areas like PCs and data centers, multi-die designs are already being used. Obviously, these applications do not face the severe environmental challenges that automotive encounters.

From an architectural point of view, SoC architects will love multi-die designs, since they essentially eliminate the reticle size limit for their design. They still need to be smart about how to split the SoC into chiplets. Moreover, while the die-to-die interfaces are short distance, high speed, and very low power compared to, say, PCIe, they certainly need to be considered when properly planning for performance, data throughput and latency.   

Compared to large monolithic SoCs, a multi-die design offers the flexibility of mixing and matching dies in different process technologies to optimize for overall power, performance, and area (PPA). Depending on the vehicle subsystem requirements, not every die must be from the most advanced node. This is beneficial, especially considering the rising costs of fabricating silicon at deep submicron process nodes. Their modularity and scalability make it easier to create derivatives, which essentially is a package redesign and not a way more costly chip tape-out. Having said that, designing silicon interposers and silicon bridges is still more costly than just an organic package substrate, since effectively they require tape outs too but at much more affordable technology nodes.

Ensuring safe, reliable operation

One major concern on multi-die designs for automotive OEMs is their long-term reliability. Even if each chiplet is designed according to automotive quality and reliability standards, assembling them on a complex package substrate with tens of thousands of micrometer-size connections is still concerning. Recently, multiple initiatives have commenced in the industry to validate quality and reliability of multi-die designs for automotive. The automotive industry is highly regulated, so, as with their monolithic counterparts, multi-die designs must adhere to standards and guidelines to ensure that they’ll operate as intended for the duration of a vehicle’s lifespan. For example:

  • Automakers must ensure their vehicles’ electronic components meet ISO 26262 functional safety standards, which aim to reduce potential hazards caused by malfunctioning electrical and electronic systems.

  • Since cars can last at least 15 years, their electronic systems must also perform reliably, safely, and securely over a long period of time. The operating environment can be rather unpredictable, with potentially large swings in temperature, severe weather conditions, vibration from different road conditions, and so on. Faults can stem from these factors and also from other vulnerabilities, such as manufacturing defects and malicious attacks. Building in fault tolerance and security (aligning with the ISO/SAE 21434 cybersecurity standard for road vehicles) can help shield automotive chips.

  • Assessing the health of the chips over their lifetimes, while detecting potential failures, is critical to reliable performance. There’s potential for idiosyncratic failures, such as the random type due to aging; physical failures, such as thermal cycling as it relates to micro-bump failures; and pattern-dependent failures. With multi-die designs, engineers must be aware of how chiplets in the system affect one another. For example, the magnetic field or high temperature of one chiplet can have ramifications for those nearby.

  • With thousands of tiny micro-bumps on a chip, some are likely to fail. Building in redundancy is one way to optimize yields. In the field, factors such as vibration can trigger problems, so building in-field chip repairability is prudent.

Open chiplet ecosystem

The idea of an open chiplet ecosystem for automotive designs has been raised more than a few times this year. With such an ecosystem, or marketplace, designers could choose chiplets from the best vendor for a particular function and be able to quickly develop differentiated derivative multi-die designs. Yet, how to address standardization remains the big question, one that reaches across all aspects of the multi-die design and calls for greater collaboration across the automotive ecosystem.

As the industry explores these issues, we might see smaller efforts emerge. Perhaps the initial availability of two chiplets, instead of several, integrated into a package. This smaller-scale approach might lend itself to proof-of-concept testing to address reliability concerns. With sectors such as AI and high-performance computing already embracing multi-die designs, proven design and verification flows, silicon lifecycle management solutions, and die-to-die IP are readily available to facilitate silicon success.

Multi-die designs for automotive will need to support increasingly demanding compute workloads in harsh, often unpredictable environments.

Captive multi-die packages designed and controlled within one company are already a reality today. In the automotive industry, they will likely come toward the end of this decade, due to the increased compute demand of SDVs. But an open chiplet ecosystem is still a vision that will probably take until the next decade to come to fruition.

Christian Malter is Executive Director - Sales Central Europe for Synopsys

About the Author

Christian Malter

Executive Director - Sales Central Europe, Synopsys

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