April 6, 1998

1 Min Read

FIB 200xP focused ion beam workstation is for R&D, failure analysis, design verification, and surface science. Equipped with a high-stability 5-axis tilt-eucentric stage, the FIB 200xP provides on-target navigation and specimen manipulation across specimens up to 50 x 50 mm, and handles various samples such as packaged semiconductor parts, wafer sections, and circuit boards. Data sheet highlights the FIB technology and the workstation's intuitive operation and control.

FEI Co., 7451 N.W. Evergreen Pkwy., Hillsboro, OR 97124, FAX (503) 640-7509.

Sign up for the Design News Daily newsletter.

You May Also Like