Ann R. Thryft
Ann Thryft has written for EDN, RTC Magazine, COTS Journal, NIkkei Electronics Asia, EE Times, Computer Design, and Electronic Buyers' News. She introduced readers to several emerging trends: early mobile phone architectures, set-top box system design, open network server and switch/router architectures, software-defined radio, and RFID. At EBN Ann won two independently judged Editorial Excellence awards for Best Technology Feature. Currently, she is a Contributing Technical Editor for Test & Measurement World, and assists in researching and writing reports for In-Stat. She holds a BA in Cultural Anthropology from Stanford University and a Certified Business Communicator certificate from the Business Marketing Association (formerly B/PAA).
Ann’s Recent activity
This batch of the latest 3D printing materials features materials that are resistant to electrostatic discharge (ESD), UV, and weather.
As bio-based and renewable plastics become more common the raw materials used for feedstock are also getting more varied.