Senior Technical Editor covering test and measurement for EDN and EE Times, October 2013 to present. Senior technical editor, Test & Measurement World from 1992 to 2012. EDN Design Ideas editor, 2008 to 2011 (I paid my dues). Editor of The Connecting Edge from 29 Oct 2012 to 13 Sept 2013 (I paid my dues). On September 27 2013, I became editor of EDN Test & Measurement DesignCenter and EE Times Test & Measurement DesignLine. Wrote six songs about life as an engineer: * The Measurement Blues * The Lab in the Corner * Check designs for EMI Early * Electrical Heroes * Below a GigaHertz * Red Eye Jedi Follow the EDN T&M Design Center on twitter @TMW_Community and follow me at @measurementblue. We're also on LinkedIn with the Test & Measurement World group.
Practically all electronic devices today contain metals that may
be coming from conflict-ravaged African countries. And political pressures will increasingly influence how these minerals are sourced and used in products.
Weaned on the relatively effortless connectivity of today’s massive variety of consumer electronic products, automation users in the IIoT will likely not tolerate too many competing, piecemeal standards for long. And the Industrial Internet Consortium is trying to preempt history.
Focus on Fundamentals consists of 45-minute on-line classes that cover a host of technologies. You learn without leaving the comfort of your desk. All classes are taught by subject-matter experts and all are archived. So if you can't attend live, attend at your convenience.