Skipping back to "formulating the question" -- one major area where "experience counts" is when you are using generic devices to interface with a DUT -- devices which don't ALLOW you to vary signal transition levels, or measure I/O currents, which don't allow you to vary rise/fall timing on an input data/clock/trigger/etc... "roll-your-own" test setups will fail to detect a large percentage of some fairly common failure modes; and you won't know that happened until you get a spike in DOA or infant-mortality stats. SOME test gear allows you to treat a test-signal source-point as a signal generator, with tight control over all specs. YOU have to know/decide when that expense is justified, considering it can damage your credibility (and job security) to have your tested devices falling over in the field.
The company says it anticipates high-definition video for home security and other uses will be the next mature technology integrated into the IoT domain, hence the introduction of its MatrixCam devkit.
Siemens and Georgia Institute of Technology are partnering to address limitations in the current additive manufacturing design-to-production chain in an applied research project as part of the federally backed America Makes program.
Most of the new 3D printers and 3D printing technologies in this crop are breaking some boundaries, whether it's build volume-per-dollar ratios, multimaterials printing techniques, or new materials types.
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