Mr E: Thanks for the comment. A complex microcontroller application, like a car starter, obviously has multiple inputs and outputs. To really exercise the on board coding, it would be prudent to run various test scenarios, and be able to produce reports for each one. I am unsure how the testing instruments would interface to the MCU package, but I can see where one would need to be inventive. For example, if the MCU package had to drive a glow plug directly, then one would want an appropriate resistive load hooked to that output. Deriving an input from this for the testing environment might take some cobbled electronics,like a hall effect current sensor, but would be necessary for real world testing. Assuming Labview could talk to the MCU via I2C or CAN, I think most of the logic response could be captured. However, does LabView provide for individual digital I/O, analog inputs, etc? Thanks again.
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For industrial control applications, or even a simple assembly line, that machine can go almost 24/7 without a break. But what happens when the task is a little more complex? That’s where the “smart” machine would come in. The smart machine is one that has some simple (or complex in some cases) processing capability to be able to adapt to changing conditions. Such machines are suited for a host of applications, including automotive, aerospace, defense, medical, computers and electronics, telecommunications, consumer goods, and so on. This discussion will examine what’s possible with smart machines, and what tradeoffs need to be made to implement such a solution.