The newest generation of the proven FISCHERSCOPEÂ®
XDAL and XDLM x-ray spectrometers is now available from Fischer Technology. The development process
focused on the unit's performance, ergonomics and design. Typical applications
are measurements on pc-boards, plug contacts and electronic components.
XDLM spectrometers are equipped with four exchangeable
apertures and a programmable XY(Z) measuring stage. This makes them ideally
suited for testing mass-produced parts.
spectrometers with silicon PIN
detectors provide reliable analysis results and coating thickness readings even
with a small concentration and very thin coatings. With their fast and highly
precise XY(Z) measuring stage, they are ideally suited for automated sample
The XDAL and
XDLM spectrometers have an excellent long-term stability, which is reflected in
a significantly reduced calibration effort, among other things. Using the
FISCHER fundamental parameter method, coating systems as well as solid and
liquid samples can be analyzed standard-free.
Everyone has had the experience of trying to scrape the last of the peanut butter or mayonnaise from the bottom of a glass jar without getting your hand sticky. Inventor Ron Jidmar thinks he has a solution to all of that nonsense with a flexible jar design that can be squeezed with one hand to lift contents from the bottom to the top of a jar or container, leaving the other hand free to scoop the contents out cleanly.
Focus on Fundamentals consists of 45-minute on-line classes that cover a host of technologies. You learn without leaving the comfort of your desk. All classes are taught by subject-matter experts and all are archived. So if you can't attend live, attend at your convenience.