The newest generation of the proven FISCHERSCOPEÂ®
XDAL and XDLM x-ray spectrometers is now available from Fischer Technology. The development process
focused on the unit's performance, ergonomics and design. Typical applications
are measurements on pc-boards, plug contacts and electronic components.
XDLM spectrometers are equipped with four exchangeable
apertures and a programmable XY(Z) measuring stage. This makes them ideally
suited for testing mass-produced parts.
spectrometers with silicon PIN
detectors provide reliable analysis results and coating thickness readings even
with a small concentration and very thin coatings. With their fast and highly
precise XY(Z) measuring stage, they are ideally suited for automated sample
The XDAL and
XDLM spectrometers have an excellent long-term stability, which is reflected in
a significantly reduced calibration effort, among other things. Using the
FISCHER fundamental parameter method, coating systems as well as solid and
liquid samples can be analyzed standard-free.