VectorStar features a completely new platform that utilizes
a new innovative architecture. It offers a new performance benchmark for
S-parameter measurements of RF, microwave and millimeter-wave devices, allowing
for the broadest frequency sweep from a single coaxial test port in a single
instrument, covering 70 kHz to 70 GHz.
For applications from 70 kHz to 2.5 GHz, a mixer-based receiver with
bridges for directional devices is used. Above 2.5GHz, a harmonic-sampling
receiver is incorporated, with the traditional couplers for directional
devices. Since the couplers are not taxed by extending to low frequencies,
available power is not traded for frequency coverage, resulting in superior
dynamic range. VectorStar now provides RF and microwave engineers a powerful
measurement tool for performance analysis of devices ranging from transistors
in an on-wafer environment to communication systems in commercial/defense
applications. Unlike other analyzers where speed compromises accuracy and trace
noise, the VectorStar's unique design architecture minimizes trace noise by
using a more coherent Source/LO pair. The result is ultra-low trace noise
without having to increase IF filtering, which slows the sweep speed. Speed is
not limited to just the display. Users can quickly download data to your
external database while moving on to the next device to maximize throughput. With a starting frequency as low as 70 kHz
and a stop frequency of 20, 40, 50 and 70 GHz, VectorStar provides the broadest
frequency coverage available. VectorStar
can also address the needs of the ultra broadband community with the capability
of spanning from 70 kHz to 110 GHz in a single coax connector.
Design collaboration now includes the entire value chain. From suppliers to customers, purchasing to outside experts, the collaborative design team includes internal and external groups. The design process now stretches across the globe in multiple software formats.
A new high-pressure injection-molding technology produces near-net shape parts with 2-inch-thick walls from high-performance materials like PEEK, PAI, and carbon-filled polymers. Parts show no voids, sinks, or porosity, have more consistent mechanical properties, and are stronger.
Focus on Fundamentals consists of 45-minute on-line classes that cover a host of technologies. You learn without leaving the comfort of your desk. All classes are taught by subject-matter experts and all are archived. So if you can't attend live, attend at your convenience.