The National Institute of Standards and Technology has developed three ASTM International standard test methods for the thin films used to make micromachines (MEMs). Published in The Annual Book of ASTM International Standards, the test proceduresófirst such standards in the worldócould faciliate global commerce in MEMs by enabling reliable measurements of MEMs devices. Detailed instructions are given for measuring thin-film dimensions and strain. For more info, go to www.eeel.nist.gov/812/test-structures.
As manufacturers add new technologies to their products, designing for compliance becomes more difficult.†Prepare for the certification testing process. Otherwise, you increase the risk of discovering a safety issue after a product leaves the assembly line. That will†cause significant time-to-market delays,†be much costlier to fix, and damage your brand in the eyes of customers.†
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