The National Institute of Standards and Technology has developed three ASTM International standard test methods for the thin films used to make micromachines (MEMs). Published in The Annual Book of ASTM International Standards, the test procedures—first such standards in the world—could faciliate global commerce in MEMs by enabling reliable measurements of MEMs devices. Detailed instructions are given for measuring thin-film dimensions and strain. For more info, go to www.eeel.nist.gov/812/test-structures.
When you think of the DARPA Robotics Challenge, you may imagine complex humanoid contraptions made of metal and wires that move like a Terminator Series T-90. But what actually happened at the much-vaunted event was something just a bit different.
Traditional dev kits are based on a manufacturer’s microcontroller, radio module, or sensor device. The idea is to aid the design engineer in developing his or her own IoT prototype as quickly as possible. A not-so-traditional IoT development kit released by Bosch aims to simplify IoT prototyping even further.
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