Keithley Instruments has released an interactive tutorial CD on reliability testing for semiconductor test engineers. Titled "Understanding Measurements: Essential Reliability Testing Techniques," the CD offers three Web seminars that discuss a range of testing issues, including: information related to stress measure testing of semiconductor devices; new measurement techniques; and tips on improving test throughput and maintaining data integrity. The CD is available free of charge at http://rbi.ims.ca/4388-519.
Transfers the control of a large number of motion axes from one numerical control kernel to another within a CNC system, using multiple NCKs, and enables implement control schemes for virtually any type of machine tool.
Focus on Fundamentals consists of 45-minute on-line classes that cover a host of technologies. You learn without leaving the comfort of your desk. All classes are taught by subject-matter experts and all are archived. So if you can't attend live, attend at your convenience.