Keithley Instruments has released an interactive tutorial CD on reliability testing for semiconductor test engineers. Titled "Understanding Measurements: Essential Reliability Testing Techniques," the CD offers three Web seminars that discuss a range of testing issues, including: information related to stress measure testing of semiconductor devices; new measurement techniques; and tips on improving test throughput and maintaining data integrity. The CD is available free of charge at http://rbi.ims.ca/4388-519.
Design collaboration now includes the entire value chain. From suppliers to customers, purchasing to outside experts, the collaborative design team includes internal and external groups. The design process now stretches across the globe in multiple software formats.
A new high-pressure injection-molding technology produces near-net shape parts with 2-inch-thick walls from high-performance materials like PEEK, PAI, and carbon-filled polymers. Parts show no voids, sinks, or porosity, have more consistent mechanical properties, and are stronger.
Focus on Fundamentals consists of 45-minute on-line classes that cover a host of technologies. You learn without leaving the comfort of your desk. All classes are taught by subject-matter experts and all are archived. So if you can't attend live, attend at your convenience.