Keithley Instruments has released an interactive tutorial CD on reliability testing for semiconductor test engineers. Titled "Understanding Measurements: Essential Reliability Testing Techniques," the CD offers three Web seminars that discuss a range of testing issues, including: information related to stress measure testing of semiconductor devices; new measurement techniques; and tips on improving test throughput and maintaining data integrity. The CD is available free of charge at http://rbi.ims.ca/4388-519.
This slideshow includes several versions of multi-materials machines, two different composites processes including one at microscale, and two vastly different metals processes. Potential game-changers down the line include three microscale processes.
Hosted CAD or PDM systems is an emerging technology that offers many advantages over traditional on premise workstation CAD configurations and is making many companies rethink how to deliver future CAD software solutions.
Focus on Fundamentals consists of 45-minute on-line classes that cover a host of technologies. You learn without leaving the comfort of your desk. All classes are taught by subject-matter experts and all are archived. So if you can't attend live, attend at your convenience.