Keithley Instruments has released an interactive tutorial CD on reliability testing for semiconductor test engineers. Titled "Understanding Measurements: Essential Reliability Testing Techniques," the CD offers three Web seminars that discuss a range of testing issues, including: information related to stress measure testing of semiconductor devices; new measurement techniques; and tips on improving test throughput and maintaining data integrity. The CD is available free of charge at http://rbi.ims.ca/4388-519.
Are they robots or androids? We're not exactly sure. Each talking, gesturing Geminoid looks exactly like a real individual, starting with their creator, professor Hiroshi Ishiguro of Osaka University in Japan.
For industrial control applications, or even a simple assembly line, that machine can go almost 24/7 without a break. But what happens when the task is a little more complex? That’s where the “smart” machine would come in. The smart machine is one that has some simple (or complex in some cases) processing capability to be able to adapt to changing conditions. Such machines are suited for a host of applications, including automotive, aerospace, defense, medical, computers and electronics, telecommunications, consumer goods, and so on. This discussion will examine what’s possible with smart machines, and what tradeoffs need to be made to implement such a solution.