Keithley Instruments has released an interactive tutorial CD on reliability testing for semiconductor test engineers. Titled "Understanding Measurements: Essential Reliability Testing Techniques," the CD offers three Web seminars that discuss a range of testing issues, including: information related to stress measure testing of semiconductor devices; new measurement techniques; and tips on improving test throughput and maintaining data integrity. The CD is available free of charge at http://rbi.ims.ca/4388-519.
This year, Design News is getting a head start on the Fourth of July celebration. In honor of our country and its legacy of engineering innovation -- in all of its forms -- we are taking you on an alphabetical tour through all 50 states to showcase interesting engineering breakthroughs and historically significant events.
Earlier this year paralyzed IndyCar drive Sam Schmidt did the seemingly impossible -- opening the qualifying rounds at Indy by driving a modified Corvette C7 Stingray around the Indianapolis Motor Speedway.
Focus on Fundamentals consists of 45-minute on-line classes that cover a host of technologies. You learn without leaving the comfort of your desk. All classes are taught by subject-matter experts and all are archived. So if you can't attend live, attend at your convenience.