icBIST3.0 embedded ATE solution is for at-speed test and diagnostics of digital and mixed-signal system-on-a-chip devices. This solution offers a scalable and reusable test strategy that delivers significant reductions in test development and manufacturing test costs for products based on very deep sub-micron (VDSM) technology of 0.35 micron or less.
LogicVision Inc., 101 Metro Dr., 3rd Floor, San Jose, CA 95110, FAX (408) 467-1180.
Focus on Fundamentals consists of 45-minute on-line classes that cover a host of technologies. You learn without leaving the comfort of your desk. All classes are taught by subject-matter experts and all are archived. So if you can't attend live, attend at your convenience.