icBIST3.0 embedded ATE solution is for at-speed test and diagnostics of digital and mixed-signal system-on-a-chip devices. This solution offers a scalable and reusable test strategy that delivers significant reductions in test development and manufacturing test costs for products based on very deep sub-micron (VDSM) technology of 0.35 micron or less.
LogicVision Inc., 101 Metro Dr., 3rd Floor, San Jose, CA 95110, FAX (408) 467-1180.
Most cyber attacks could be avoided by adopting a list of Critical Security Controls that were created by the Center for Internet Security. That’s the message from Steve Mustard of the Automation Federation.
How 3D printing fits into the digital thread, and the relationship between its uses for prototyping and for manufacturing, was the subject of a talk by Proto Labs' Rich Baker at last week's Design & Manufacturing Minneapolis.
Focus on Fundamentals consists of 45-minute on-line classes that cover a host of technologies.
You learn without leaving the comfort of your desk. All classes are taught by subject-matter experts and all are archived.
So if you can't attend live, attend at your convenience.