Literature outlines features and benefits of the Fischerscope(reg) x-ray system XDL. This system is for measuring coating thickness and coating composition on single, binary- and ternary-alloy, double, and triple coatings; and double coatings with one alloy layer. Materials analysis can be done on alloys containing up to four different elements.
Focus on Fundamentals consists of 45-minute on-line classes that cover a host of technologies. You learn without leaving the comfort of your desk. All classes are taught by subject-matter experts and all are archived. So if you can't attend live, attend at your convenience.