Keithley Instruments Inc. (http://rbi.ims.ca/3850-508) has developed the free Nanotech Toolkit—a set of software tools that can shortcut many measurement tasks by providing common routines used in testing nanotech devices. The toolkit is compatible with Keithley's Model 4200-SCS Semiconductor Characterization System, which offers sub-femtoamp (10-15) current measurement resolution and measurement routines for testing a carbon nanotube-based transistor, a bio-component, molecular transistor, molecular wire, nanowire, and a nanocell.
With a better understanding of materials’ response to load and temperature, researchers could potentially use the knowledge to improve design. The research could even help geologists studying plate tectonics.
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