Researchers at Sandia National Labs are using thermally induced voltage alteration (TIVA) and Seebeck-effect imaging for finding failures in integrated circuits. The technique allows inspection of both the front and back of integrated circuits. It uses the beam from an infrared laser that operates at wavelengths for which silicon is transparent. By heating only small portions of the integrated circuit, the researchers produce a voltage change that is biased with a current source. The reflected light image, which when registered with the TIVA image, allows identification of circuit flaws, according to developer Ed Cole. For more information, contact him at email@example.com or call (505) 844-1421.
Sciaky, provider of electron-beam additive manufacturing (EBAM) services, will start selling these machines commercially in September. The company has used its EBAM 3D printing technology for making very large, high-value, metal prototypes and production parts for aerospace and defense OEMs.
At this year’s Google I/O, the spotlight was pointed on gender inequality in the high-tech industry. Google has established a new initiative that it hopes will even out the playing field, Made w/Code. Part of this initiative will fund free online courses in basic coding.
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