Researchers at Sandia National Labs are using thermally induced voltage alteration (TIVA) and Seebeck-effect imaging for finding failures in integrated circuits. The technique allows inspection of both the front and back of integrated circuits. It uses the beam from an infrared laser that operates at wavelengths for which silicon is transparent. By heating only small portions of the integrated circuit, the researchers produce a voltage change that is biased with a current source. The reflected light image, which when registered with the TIVA image, allows identification of circuit flaws, according to developer Ed Cole. For more information, contact him at email@example.com or call (505) 844-1421.
Festo's BionicKangaroo combines pneumatic and electrical drive technology, plus very precise controls and condition monitoring. Like a real kangaroo, the BionicKangaroo robot harvests the kinetic energy of each takeoff and immediately uses it to power the next jump.
Design News and Digi-Key presents: Creating & Testing Your First RTOS Application Using MQX, a crash course that will look at defining a project, selecting a target processor, blocking code, defining tasks, completing code, and debugging.
Focus on Fundamentals consists of 45-minute on-line classes that cover a host of technologies. You learn without leaving the comfort of your desk. All classes are taught by subject-matter experts and all are archived. So if you can't attend live, attend at your convenience.