Brochure describes the Integrated Testing Database System which allows a user to import data and transducer data from a variety of testing sources, store the data on a single computer platform, identify the specific test information, and simultaneously view the data from multiple images and the results from multiple analyses. The system incorporates a DataBuilder and DataViewer with a Capture and Review System.
NAC Image Technology, 980 Enchanted Way, Suite 203, Simi Valley, CA 93065, FAX (805) 584-3642.
Digital healthcare devices and wearable electronic products need to be thoroughly tested, lest they live short, ignominious lives, an expert will tell attendees at UBM’s upcoming Designers of Things conference in San Jose, Calif.
Focus on Fundamentals consists of 45-minute on-line classes that cover a host of technologies. You learn without leaving the comfort of your desk. All classes are taught by subject-matter experts and all are archived. So if you can't attend live, attend at your convenience.