Bruker Elemental has introduced the S1 Turbosdr handheld XRF analyzer for in-situ measurement of heavy metals and other restricted materials. The S1 Turbosdr’s elemental chemistry reports were designed to provide results for many types of restricted materials screening, including all RCRA pollutant metals. Bruker notes that the S1 Turbosdr is portable (2 kg) and the analyzer can easily be taken to the job-site rather than collecting samples and transporting them to the laboratory. The S1 Turbosdr is GPS compatible to allow for mapping the results.
The tool uses X-Ray Fluorescence (XRF) for testing of heavy metals at contaminated sites. According to Bruker, the key to the success of the S1 Turbosdr handheld XRF analyzer is Bruker’s XFlash Silicon Drift Detector (SDD) technology, which offers count rates and resolution superior to alternative SiPIN detector technology. The large solid angle and the high count rate capability of the industry-leading XFlash SDD allows the user to take full advantage of the fluorescent radiation emitted from the sample, resulting in lower detection limits and shorter measurement times.
For industrial control applications, or even a simple assembly line, that machine can go almost 24/7 without a break. But what happens when the task is a little more complex? That’s where the “smart” machine would come in. The smart machine is one that has some simple (or complex in some cases) processing capability to be able to adapt to changing conditions. Such machines are suited for a host of applications, including automotive, aerospace, defense, medical, computers and electronics, telecommunications, consumer goods, and so on. This discussion will examine what’s possible with smart machines, and what tradeoffs need to be made to implement such a solution.