Increase Productivity with Graphical Programming National Instruments LabVIEW is an industry-leading software tool for creating user-defined design, control, and test systems. Take advantage of powerful features for developing measurement applications and open connectivity tools to integrate external applications and services. View interactive demos and try LabVIEW FREE online.
PXI Turns 10 The PXI test equipment standard got off the ground ten years ago. Meet the PXI pioneers and learn what they think of the standard after a full decade of growth. Full Story Self Monitoring Comes to Pneumatic DevicesA new generation of pneumatic actuators and other devices features built-in leak detection capabilities to help spot problems early. Full Story Parallel Testing is the KeyA new book from Keithley Instruments provides an overview of methods for raising efficiency by employing parallel testing of electronic devices. Full Story A “CSI” Primer on Wire Failure in Magnetic ApplicationsGet up close and personal with some grim looking micrographics — and learn the clues that can pinpoint the causes of failure. Full Story
Transformer Input Voltage If I were to buy a neon sign transformer that says it is an input (primary) of 120V and an output (secondary) of 15 kV, do I have to give it 120V on the primary? Post a Reply
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Pulse EngineeringPulse is worldwide leader in electronic component design and manufacturing. Our products are used in computers, WAN and LANs, wireless applications, telecom, broadband Internet, power conversion, defense, aerospace, and automotive and consumer electronics. With both catalog parts and custom design capability, we are a complete source for electronic OEMs and CEMs worldwide. View All Resources from Pulse Engineering
Test-Drive LabVIEW: Free Evaluation SoftwareNational Instruments | Evaluation Kit Space-saving, compact holders for sub-miniature fuses, ideal for dense PCB use. Barrier Design protects leads from arcing, THM mounting secures position during wave soldering. UL94V-0 thermoplastic base, low contact resistant Gold plated BeCu springs; Tin-plate Brass pins. 2 Sturdy-Mount types, a Low Profile & a PCB Space-Saver design also available.
Designing Next Generation Test SystemsNational Instruments | Application Notes This developer's guide, titled "Designing Next Generation Test Systems," includes white papers that address challenges that continue to pressure engineering teams to reduce the cost and time of test; provide insight into how test managers and engineers are overcoming these challenges, and offers guidelines on building modular, software-defined test systems that significantly increase test system throughput and flexibility while reducing overall cost.
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New Capabilities May Have You Pining for a FIR Filter PXI Turns 10 Self Monitoring Comes to Pneumatic Devices Parallel Testing is the Key A “CSI” Primer on Wire Failure in Magnetic Applications Transformer Input Voltage Resource Center Contact Us
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