It is a good article however I would disagree that the traditional approach would start with solving the ODE. We normally start using an Laplace transform and writing the transfer funtion. From this, the poles of the system can be identified and any significant problems identified before spending the time to create a complex model.
I would recommend never skipping the back of the envelope analysis. It is very valuble to use it check that your model is locked in.
To get to a trillion sensors in the IoT that we all look forward to, there are many challenges to commercialization that still remain, including interoperability, the lack of standards, and the issue of security, to name a few.
From design feasibility, to development, to production, having the right information to make good decisions can ultimately keep a product from failing validation. The key is highly focused information that doesn’t come from conventional, statistics-based tests but from accelerated stress testing.
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